Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Repost)
M. Bushnell, Vishwani Agrawal, "Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits"
S,..er | ISBN: 0792379918 | 2000 | PDF | 713 pages | 37 mb
S,..er | ISBN: 0792379918 | 2000 | PDF | 713 pages | 37 mb
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.