Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices
Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices by Paul van der Heide
English | 2014 | ISBN: 1118480481 | 384 pages | PDF | 3,7 MB
English | 2014 | ISBN: 1118480481 | 384 pages | PDF | 3,7 MB
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other